The double ratios of integrated yields as a function of $S_0^{p_{\rm T}=1}$ for the spectra of top-1\% $N_{\rm tracklet}^{|\eta|< 0.8}$. The yield is estimated by extrapolating the spectra over the full $p_{\rm T}$ range. Statistical and systematic uncertainties are shown by bars and boxes, respectively. The grey band around unity represents the systematic uncertainty of the pion measurement.