ALPIDE chip hit-position resolution and average cluster size as a function of global threshold setting. Beam test results with \SI{6}{\giga eV/\it{c}} pions with perpendicular incidence. ALPIDE substrate reverse bias: ${\rm -3 V}$. |  |
ALPIDE chip hit-position resolution and average cluster size as a function of global threshold setting. Beam test results with \SI{6}{\giga eV/\it{c}} pions with perpendicular incidence. ALPIDE substrate reverse bias: ${\rm -3 V}$. | |