Self-normalized yield of $\Upsilon$(nS) states as a function of normalized charged-particle multiplicity for $p_{\rm{T}} > 0$. The error bars represent the statistical uncertainty on the $\Upsilon$ yields, while the quadratic sum of the point-by-point systematic uncertainties on the $\Upsilon$ yield as well as on $\textrm{d}N_{\mathrm{ch}} / \textrm{d}\eta$ / $\langle \textrm{d}N_{\mathrm{ch}}/\textrm{d}\eta \rangle$ is depicted as boxes. The dashed line shown in the top panel represents a linear function with the slope equal to unity..